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Dr. Mehran Jamshidifar

room: 
H-E 311
phone: 
0271 740 - 2470
address: 

Universität Siegen
Lehrstuhl für Höchstfrequenztechnik
57068 Siegen



2016

PhD Thesis

[bib] - M. Jamshidifar - On-wafer characterization of mm-wave and THz circuits using electrooptic sampling
In Phd Thesis, Universität Siegen, 2016 - [pdf]

2013

Articles/Journal Papers

[bib] - M. Jamshidifar, P. Haring Bolivar - Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits
In Optics express, 21(4), 2013, pages 4396-4404

Conference Papers

[bib] - M. Jamshidifar, P. Haring Bolivar - Extremely low-jitter and ultra-broadband electrooptic sampling system for near field sensing of active and passive sub-THz electronic devices
In Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on, 2013, pages 1-2
[bib] - M. Jamshidifar, G. Spickermann, H. Schaefer Eberwein, P. Haring Bolivar - Low-jitter electrooptic sampling of active mm-Wave devices up to 300 GHz
In Microwave Conference (EuMC), 2013 European, 2013, pages 752-754

2012

Articles/Journal Papers

[bib] - M. Jamshidifar, G. Spickermann, H. Schäfer, P. Haring Bolívar - 200-GHz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling
In Microwave Opt. Tech. Lett., 54, 2012, pages 1858-1862 - [pdf]